Test Design Module for Silicon Photonics Design
It will be possible to incorporate test requirements from the design stage!
We would like to introduce our "Test Design Kit (TDK)." This is a module that supports wafer-level test design in the development of silicon photonics and photonic integrated circuits (PICs). By using standardized test templates, it streamlines layout design and automates the test design for photonic chips. 【Features】 ■ Reduction of test time ■ Decrease in test costs ■ Improvement in batch test efficiency *For more details, please download the PDF or feel free to contact us.
- Company：日本レーザー
- Price：Other
